On some reliability implications of electronic circuit designPULLEN, K. A. JR.IEEE transactions on reliability. 1983, Vol 32, Num 1, pp 106-110, issn 0018-9529Article

Sensitivity analysis of D.C. diode-transistor circuitsTADEUSIEWICZ, M.AEU. Archiv für Elektronik und Übertragungstechnik. 1989, Vol 43, Num 3, pp 175-180, issn 0001-1096, 6 p.Article

Il caos: metodi analitici e fenomeni relativi ai sistemi elettronici = Le chaos: méthodes analytiques et phénomènes relatifs aux systèmes électroniques = The chaos: analytic methods and phenomenons in relation with electronic systemsMANFREDI, C.Alta frequenza. 1988, Vol 57, Num 4, pp 117-128, issn 0002-6557, 12 p.Article

A high-performance portable EEG amplifierSMITH, J. R; KUEING-LONG CHEN.Sleep (New York, NY). 1983, Vol 16, Num 3, pp 286-288, issn 0161-8105Article

Stop taking your models for grantedAJLUNI, C.Electronic design. 1999, Vol 47, Num 5, pp 48-56, issn 0013-4872, 5 p.Article

Society of reliability engineers bulletinREICHE, H.Microelectronics and reliability. 1990, Vol 30, Num 4, issn 0026-2714, p. 809Article

New structure for digital switching networkJAJSZCZYK, A.Electronics Letters. 1989, Vol 25, Num 3, pp 209-211, issn 0013-5194, 3 p.Article

Computer design of electronic circuitsFULLER, A. J. B.Computer-aided engineering journal. 1988, Vol 5, Num 5, pp 184-190, issn 0263-9327Article

Quench detector circuit for superconductor testingDUBE, W. P; GOODRICH, L. F.Review of scientific instruments. 1986, Vol 57, Num 4, pp 680-682, issn 0034-6748Article

Auxiliary circuit for the adjustment of transmitters for powering implants by coupled coilsDONALDSON, N. DE N.Medical & biological engineering & computing. 1983, Vol 21, Num 6, pp 762-763, issn 0140-0118Article

View of Technical Committee on Electronic Circuits on the Progress of Electronic Circuit Technologies in the Past Decade and the Future Prospects : The activity and technical trend reported by Each IEEJ SocietyTAKAGI, Shigetaka.IEEJ transactions on electrical and electronic engineering. 2009, Vol 4, Num 1, pp 29-30, issn 1931-4973, 2 p.Article

2007 Asian Solid-State Circuits Conference (A-SSCC'07)LU, Nicky; JOU, Shyh-Jye.IEEE journal of solid-state circuits. 2008, Vol 43, Num 11, pp 2351-2421, issn 0018-9200, 70 p.Conference Paper

Transputer arrays for solving partitioned systems of linear equationsAL-TURAIGI, M; AFIFI, M; EL-AZHARY, I et al.International journal of electronics. 1989, Vol 66, Num 5, pp 789-800, issn 0020-7217, 12 p.Article

2009 International Electron Devices and Materials Symposium (IEDMS)LIOU, Juin J; LAI, Chao Sung.Microelectronics and reliability. 2010, Vol 50, Num 5, issn 0026-2714, 178 p.Serial Issue

Comment faire encore plus petit, plus rapide et moins cher ?DEGREZ, Gaëlle.Technologies internationales (Strasbourg). 2005, Num 112, pp 23-26, issn 1165-8568, 4 p.Article

Roboter lackiert Elektronikgehäuse : Erfahrungen nach zweijährigem Einsatz = Electronics housings painted by robotZANDER, H.Metalloberfläche. 1991, Vol 45, Num 1, pp 11-13, issn 0026-0797, 3 p.Article

Bayesian point estimation for the parameters and reliability function of a bivariate exponential modelNAKAO, Z; ZENG-ZHONG LIU.Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E. 1988, Vol 71, Num 9, pp 833-836, issn 0387-236XArticle

Une expérience d'électricité. II: Régulation de la température d'un four (simulation) = Electricity experiment. II. Fournace temperature regulation (simulation)MOREAU, R.Revue du Palais de la Découverte. 1985, Vol 13, Num 128, pp 69-72, issn 0339-7521Article

Modernisation du rhéographe RG4-01SMIRNOV, V. M; LYTCHKOVA, A. E; LYTCHKOV, A. A et al.Fiziologičeskij žurnal SSSR im. I.M. Sečenova. 1984, Vol 70, Num 2, pp 261-263, issn 0015-329XArticle

ACORN: a system for CVS macro design by tree placement and tree customizationHAUGE, P. S; YOFFA, E. J.IBM journal of research and development. 1984, Vol 28, Num 5, pp 596-602, issn 0018-8646Article

Analogue instrumentation for processing polarographic dataOLDHAM, K. B; ZOSKI, C. G.Journal of electroanalytical chemistry and interfacial electrochemistry. 1983, Vol 157, Num 1, pp 27-51, issn 0022-0728Article

Soft errors in circuits and systemsHEIDEL, David F; HERGENROTHER, Jack M; RODBELL, Kenneth P et al.IBM journal of research and development. 2008, Vol 52, Num 3, issn 0018-8646, 94 p.Serial Issue

Fluctuation spectrum for a new type of intermittency in a coupled electronic circuitFUKUSHIMA, K; YAMADA, T; YAZAKI, T et al.Journal of the Physical Society of Japan. 1990, Vol 59, Num 8, pp 2659-2666, issn 0031-9015Article

Quadratic convergence of the homotopy method using a rectangular subdivisionYAMAMURA, K; HORIUCHI, K.Transactions of the Institute of electronics, information and communication engineers. 1989, Vol 72, Num 3, pp 188-193, issn 0913-574X, 6 p.Article

A rotator for X/Y oscilloscope displaysHEELEY, D. W.Behavior research methods and instrumentation. 1983, Vol 15, Num 5, pp 503-507, issn 0005-7878Article